BSEN60749-4:2017 Bsl Standards Publication Semiconductor devices - Mechanical and climatic test methods Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (IEC 60749-4:2017) bsi. BSEN60749-4:2017 BRITISH STANDARD National foreword This British Standard is the UKimplementation of EN60749-4:2017.It is identicaltoIEC60749-4:2017.It supersedesBSEN60749-4:2002, which is withdrawn. TheUKparticipationinitspreparationwas entrusted to Technical Committee EPL/47,Semiconductors. A list oforganizations represented on this committee can be obtained on requestto its secretary. This publication does not purport to include all the necessary provisions ofa contract. Users are responsible for its correct application. @TheBritishStandards Institution2017 Published by BSI Standards Limited 2017 ISBN9780580942297 ICS31.080.01 Compliance with a British Standard cannot confer immunityfrom legal obligations. This British Standard was published under the authority of the StandardsPolicyandStrategyCommitteeon30November2017. Amendments/corrigendaissuedsincepublication Date Text affected BSEN60749-4:2017 EUROPEANSTANDARD EN 60749-4 NORMEEUROPEENNE EUROPAISCHENORM June 2017 ICS31.080.01 Supersedes EN 60749-4:2002 English Version Semiconductordevices-Mechanicalandclimatictestmethods Part 4: Damp heat, steady state,highly accelerated stress test (HAST) (IEC 60749-4:2017) Dispositifs a semiconducteurs - Methodes d'essais Halbleiterbauelemente - Mechanische und klimatische mecaniques et climatiques - Partie 4: Essai continu Prufverfahren - Teil 4: Feuchte Warme, konstant, Prufung fortement accelere de contrainte de chaleur humide (HAST) mit hochbeschleunigter Wirkung (HAST) (IEC 60749-4:2017) (IEC 60749-4:2017) This European Standard was approved by CENELEC on 2017-04-07. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as the official versions. Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Gemany, Greece, Hungary, iceland, Ireland, Itaiy, Latvia Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, siovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. CENELEC European Committee for Electrotechnical Standardization Comite Europeen de Normalisation Electrotechnique Europaisches Komitee fir Elektrotechnische Normung CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels @2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members. Ref. No.EN 60749-4:2017 E
IEC 60749-4 2017 Semiconductor devices - Mechanical and climatic test methods - Part 4 Damp heat steady state highly accelerated stress test (HAST)
文档预览
中文文档
16 页
50 下载
1000 浏览
0 评论
309 收藏
3.0分
温馨提示:本文档共16页,可预览 3 页,如浏览全部内容或当前文档出现乱码,可开通会员下载原始文档
本文档由 人生无常 于 2025-03-30 08:46:37上传分享